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VTE-7100 Engineering / Compliance Tester
High-performance Engineering / Compliance Tester supporting the following devices:
- SD Cards (UHS-I, UHS-II, SD Express7.0, 7.1, 8.0)
- eMMC chips (5.1)
- NVMe SSD Drives (Gen3, Gen4)
- UFS3.1 & 4.0 Memory cards and Chips (3.1, 4.0)
- NAND Flash Chips (SLC, MLC, TLC, QLC, 3D, ONFI)
- C-MOS Sensors (MIPI D-PHY, C-PHY, M-PHY, A-PHY)
The VTE-7100 hardware consists of a Base System and dedicated Device Adapters for the devices to be tested.
The VTE-7100 software includes a C-like test script Integrated Development Environment (IDE), with Device Libraries for supported devices.
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ICS-CD25X8 Image Capture Card
The ICS-CD25X8 is a single channel Image Capture Card designed to test MIPI sensors supporting the following interfaces:
- MIPI C-PHY Sensors (max speed 2.5 Gsps, 3.5/4.5 Gsps Q4 2021)
- MIPI D-PHY Sensors (max speed 2.5 Gbps, 3.5/4.5 Gbps Q4 2021)
Additional Image Capture Cards available soon, supporting the following interfaces:
- MIPI A-PHY Sensors (under development)
- MIPI M-PHY Sensors (under development)
The ICS cards are capable of performing frame captures in a local data buffer in continuous and on-demand modes, as well as performing frame data processing such as frame averaging in real time (on-the-fly).
A high bandwidth host interface in conjunction with a DMA driver allow for sustained real-time transfer of captured images to the host PC.
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IST-CD25X8 Image Sensor Tester
The IST-CD25X8 is a high performance image Sensor Tester designed to test the latest generation of CMOS image sensors supporting the following interfaces:
- MIPI C-PHY Sensors (max speed 2.5 Gsps, 3.5/4.5 Gsps Q4 2021)
- MIPI D-PHY Sensors (max speed 2.5 Gbps, 3.5/4.5 Gbps Q4 2021)
Additional Image Sensor Testers available soon, supporting the following interfaces:
- MIPI A-PHY Sensors (under development)
- MIPI M-PHY Sensors (under development)
The IST testers can capture frames in continuous and on-demand modes. A MIPI protocol analyzer performs packet analysis/processing, CRC verification and real-time image frame capture. An internal frame buffer allows for storage of captures frames. A high bandwidth host interface in conjunction with a DMA driver allow for sustained real-time transfer of captured images to the host PC.
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VTE-4100 Engineering / Compliance Tester
High-performance Engineering / Compliance Tester supporting the following devices:
- SD Cards (UHS-I, UHS-II)
- eMMC chips (5.1)
- NAND Flash Chips (SLC, MLC, TLC, QLC, 3D, ONFI)
The VTE-4100 hardware consists of a Base System and dedicated Device Adapters for the devices to be tested.
The VTE-7100 software includes a C-like test script Integrated Development Environment (IDE), with Device Libraries for supported devices.
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AVTE-7100 Fully Automated Production Tester
High- performance, fully automated Production Tester accepts up to 36 VTE-7100 or VTE-4100 Test channels with up to 16 test sockets each, for a total of up to 576 test sockets.
The AVTE-7100 can be also configured with up to 4 JEDEC tray handlers holding up to 60 JEDEC trays, for a total of up to 240 JEDEC trays.
A high precision robot arm is moving devices under test between the JEDEC trays and test sockets with a horizontal speed of 7m/sec and accuracy of 0.02mm horizontal / 0.01mm vertical.
Typical cycle time (device load/unload) is 2.5s.
Reference system throughput of 1,152 SD cards tested/programmed per hour with a 576 socket configuration.
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AVTE-3008 Fully Automated Production Tester
High-performance, fully automated Production Tester accepts up to 32 VTE-7100 or VTE-4100 Test channels with up to 32 test sockets each, for a total of up to 1,024 test sockets.
The AVTE-7100 employs 5 JEDEC tray handlers holding up to 80 JEDEC trays, for a total of up to 400 JEDEC trays.
A high precision cartesian robot is moving devices under test between the JEDEC trays and test sockets with a horizontal speed of 8m/sec and accuracy of 0.01mm horizontal / 0.01mm vertical.
The robot can pick up 8 devices at a time, with a typical cycle time of 8 sec.
Reference system throughput of 8,000 SD cards tested/programmed per hour with a 1024 socket configuration.
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AVTE-8010 Semi-Automated In-Tray Tester with optional Thermal Chamber
High- performance, fully automated Production Tester accepts up to 4 VTE-7100 or VTE-4100 Test channels with up to 32 test sockets each, for a total of up to 128 test sockets.
The tester includes an integrated thermal chamber allowing for devices under test to be thermally cycled with a temperature range of -25C to +85C.
Typical applications include:
- Production Testing at high/low temperatures
- Accelerated Aging Testing
- Design Validation
- Quality Control tests
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