The AVTE-3000 contains 8 test channels, each of
them containing a load plate populated with test
sockets.
Typical configurations include:
• uSD cards: 8 channels with 128 sockets per
test channel (1,024 test sockets max)
• NAND chips: 8 channels with 96 sockets per
test channel (768 test sockets max)
• SD, miniSD, uSD cards
• MMC, RS-MMC cards
• CF cards
• SATA/PATA SSD
• NAND, NOR devices
• Virtually all Flash memory card packages
• TSOP, TSSOP
• BGA, microBGA