The VTE-3100 is the #1 choice world-wide for official compliance and engineering test solutions for Flash memory cards. The system also supports all common NAND devices on the market.

The VTE-3100 offers more flexibility than any other tester on the market, supporting the current Flash cards on the market.

The VTE-3100 can be configured internally under software control with customized test processors, supporting any type of Flash memory storage device, and offering true real-time test capabilities.

A Protocol Analyzer configuration of the VTE-3100 is also offered, supporting current flash memory storage and host devices.


Features:


Adapters available for: NAND, SD, MMC, CF, USB, MS, e.MMC, SATA SSD

The compact size and USB interface make the VTE-3100 a portable, easy-to-install engineering tool

Clock Speeds up to 208Mhz+

Supports Vdd voltages from 0V-6.5V

Supports 1/4/8/16 bit data bus

True RMS Idd Current Measurement

Clock shift capability versus data/control signals with 50pS resolution

Windows Vista or Windows 7 operating system supported

Scripts 100% compatible with production testers

VTE-3100 with VTE Protocol Analyzer Pass-Through Cable Inserted into Host Device


Above: VTE-3100 with VTE Protocol Analyzer
Pass-Through Cable Inserted into Host Device


VTE-3100 Test SW Library Screen Capture


Above: Actual VTE-3100 Test SW Library Screen Capture with optional embedd Protocol Analyzer


VTE-3100 with MMC 4.3 multi-socket test adapter supporting all e.MMC BGA type


Above: VTE-3100 with MMC 4.3 multi-socket test adapter supporting all e.MMC BGA types


VTE-3100 with dual socket adapter for CF cards


Above: Actual VTE-3100 with dual socket adapter for CF cards


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